Cyclic stress tests for full scan circuits
نویسندگان
چکیده
To ensure the production of reliable circuits and fully testable unpackaged dies for MCMs burn-in, both dynamic and monitored, remains a feasible option. During this burn-in process the circuit needs to be stressed for an extended period of time. This requires computation of cyclic input sequences to stress the circuit. A taxanomy of stress related problems for full scan circuits is presented. It is shown that there are efficient ways to compute the sequences for most variations of monitored burn-in problems. The difficulty of computing stress tests for dynamic burn-in problems is discussed. Preliminary experimental results on ISCAS89 benchmark circuits are presented.
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